On the formation mechanism of MCs2+ molecular ions under varying oxygen environment
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference17 articles.
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1. Quantitative MCsn+ - SIMS for direct compositional analysis of interfaces of low-dimensional structures;AIP Conference Proceedings;2012
2. Inelastic ion-surface collisions: Understanding secondary emission of molecular ions;Journal of Physics: Conference Series;2009-09-01
3. Ultra-high depth resolution SIMS for the interface analysis of complex low-dimensional structures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-04
4. Secondary emission of MCsn+ molecular ions under the joint influence of electropositive and electronegative elements;Surface Science;2008-03
5. Atomic spectrometry update. Atomic mass spectrometry;Journal of Analytical Atomic Spectrometry;2008
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