Secondary ion emission from Ti, V, Cu, Ag and Au surfaces under KeV Cs+ irradiation-Reference-Cited by-同舟云学术

Secondary ion emission from Ti, V, Cu, Ag and Au surfaces under KeV Cs+ irradiation

Published:2005-02 Issue:1 Volume:229 Page:35-45
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

van der Heide P.A.W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference50 articles.

2. Secondary Ion Mass Spectrometry; A Practical Handbook for Depth Profiling and Bulk Impurity Analysis;Wilson,1989

3. Secondary Ion Mass Spectrometry; Basic Concepts, Instrumental Aspects, Applications and Trends;Benninghoven,1987

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