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Highly sensitive molecular detection with swift heavy ions

Published:2011-10 Issue:20 Volume:269 Page:2251-2253
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Wakamatsu Yoshinobu,Yamada Hideaki,Ninomiya Satoshi,Jones Brian N.,Seki Toshio,Aoki Takaaki,Webb Roger,Matsuo Jiro

Funder

Core Research of Evolutional Science and Technology

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference21 articles.

1. SIMS investigations into the effect of growth conditions on residual impurity and silicon incorporation in GaN and AlxGa1−xN

2. Localization of Na+ and K+ in rat cerebellum with imaging TOF-SIMS

3. Localization of cholesterol, phosphocholine and galactosylceramide in rat cerebellar cortex with imaging TOF-SIMS equipped with a bismuth cluster ion source

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1. Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique;Materials;2021-10-20

2. Innovative Technologies in Advanced SIMS : Toward Organic and Biological Material Analysis;Vacuum and Surface Science;2021-10-10

3. Correlative Imaging of Trace Elements and Intact Molecular Species in a Single-Tissue Sample at the 50 μm Scale;Analytical Chemistry;2021-10-01

4. MeV-SIMS measurement of lithium-containing electrolyte;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09

5. Secondary ion mass spectrometry measurements under ambient and humid conditions using MeV ions;Journal of Vacuum Science & Technology B;2020-05

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