Author:
Komatsu Yuji,Harata Daisuke,Schuring Erik W.,Vlooswijk Ard H.G.,Katori Shigetaka,Fujita Shizuo,Venema Peter R.,Cesar Ilkay
Reference13 articles.
1. Electrochemical capacitance characterization of n-type gallium arsenide;Ambridge;J Appl Electrochem,1974
2. Doping profile analysis in Si by electrochemical capacitance-voltage measurements;Peiner;J Electrochem Soc,1995
3. Accurate extraction of doping profiles from electrochemical capacitance voltage measurements;Bock;Proc of 23rd EU-PVSEC,2008
4. Dopant profiles of laser-doped multicrystalline silicon wafers from electrochemical capacitance-voltage measurements;Heinrich;Proc of 27th EU-PVSEC,2012
5. Efficiency improvement by deeper emitter with lower sheet resistance for uniform emitters;Komatsu;Energy Procedia,2011
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