Testable design of AND–EXOR logic networks with universal test sets
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,General Computer Science,Control and Systems Engineering
Reference21 articles.
1. Easily testable realizations for logic functions;Reddy;IEEE Trans Comput,1972
2. Universal test sets for multiple fault detection in AND–EXOR arrays;Pradhan;IEEE Trans Comput,1978
3. A minimal universal test set for self-test of EXOR Sum-of-Products circuits;Kalay;IEEE Trans Comput,2000
4. Fault detecting test sets for Reed–Muller Canonic networks;Saluja;IEEE Trans Comput,1975
5. Logic synthesis and optimization;Sasao,1993
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. FPRM Circuit Area Optimization Based on Optimized Sparrow Search Algorithm;2022 6th International Conference on Robotics and Automation Sciences (ICRAS);2022-06-09
2. An Elitist Non-Dominated Multi-Objective Genetic Algorithm Based Temperature Aware Circuit Synthesis;International Journal of Interactive Multimedia and Artificial Intelligence;2020
3. Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates;Journal of Applied and Industrial Mathematics;2018-04
4. On the exact value of the length of the minimal single diagnostic test for a particular class of circuits;Journal of Applied and Industrial Mathematics;2017-07
5. PMGA and its application in area and power optimization for ternary FPRM circuit;Journal of Semiconductors;2016-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3