Investigation of thermoelectric silicide thin films by means of analytical transmission electron microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Effect of interphase boundaries on resistivity and thermopower of nanocrystalline Re-Si thin film composites
2. Thermoelectric properties of a composite medium
3. Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM
4. Experimental study of the effect of quantum-well structures on the thermoelectric figure of merit
5. Electron diffraction analysis of polycrystalline and amorphous thin films
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Reactive Diffusion in the Re-Si System;Journal of Phase Equilibria and Diffusion;2014-09-18
2. TiSi2Ox Coated N-Doped Carbon Nanotubes as Pt Catalyst Support for the Oxygen Reduction Reaction in PEMFCs;The Journal of Physical Chemistry C;2013-07-17
3. Structural, electronic and optical properties of semiconducting rhenium silicide;Journal of Physics: Condensed Matter;2004-01-09
4. Nanostructure and thermoelectric properties of ReSi 2±x thin films;Analytical and Bioanalytical Chemistry;2002-10-01
5. Electronic structure of rhenium disilicides;Journal of Physics: Condensed Matter;2002-07-02
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