Electronic structure of rhenium disilicides
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/14/i=27/a=307/pdf
Reference22 articles.
1. Electronic properties of semiconducting FeSi2films
2. Epitaxial films of semiconducting FeSi2on (001) silicon
3. XPS and factor analysis for investigation of sputter-cleaned surfaces of metal (Re, Ir, Cr)–silicon thin films
4. Investigation of thermoelectric silicide thin films by means of analytical transmission electron microscopy
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Formation of the Al3Si metastable phase in Al-Si films obtained by ion-beam sputtering according to experimental and theoretical data;Thin Solid Films;2023-05
2. Electronic structure of the full-Heusler Co$$_{2-x}$$Fe$$_{1+x}$$Si and half-Heusler CoFeSi alloys obtained by first-principles calculations and ultrasoft X-ray emission spectroscopy;The European Physical Journal B;2022-03
3. Formation of Unsaturated Hydrocarbons and Hydrogen: Surface Chemistry of Methyltrioxorhenium(VII) in ALD of Mixed-Metal Oxide Structures Comprising Re(III) Units;Chemistry of Materials;2019-09-12
4. Energetic consideration of defected rhenium disilicide, ReSi 2-x, and the electronic structure of Re 4 Si 7 (ReSi 1.75 ), revisited;Computational Condensed Matter;2018-03
5. Electronic structure of Pt-substituted clathrate silicides Ba8Pt x Si46–x (x = 4–6);Semiconductors;2016-04
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3