Reactive Diffusion in the Re-Si System
Author:
Publisher
Springer Science and Business Media LLC
Subject
Materials Chemistry,Metals and Alloys,Condensed Matter Physics
Link
http://link.springer.com/content/pdf/10.1007/s11669-014-0334-6.pdf
Reference29 articles.
1. U. Gottlieb, M. Affronte, F. Nava, O. Laborde, A. Sulpice, and R. Madar, Some Physical-Properties of ReSi1.75 Single-Crystals, Appl. Surf. Sci., 1995, 91(1-4), p 82-86
2. J.P. Becker, J.E. Mahan, and R.G. Long, Resi2 Thin-Film Infrared Detectors, J. Vac. Sci. Technol. A, 1995, 13(3), p 1133-1135
3. T.A.N. Tan, J.Y. Veuillen, P. Muret, S. Kennou, A. Siokou, S. Ladas, F.L. Razafindramisa, and M. Brunel, Semiconducting Rhenium Silicide Thin-Films on Si (111), J. Appl. Phys., 1995, 77(6), p 2514-2518
4. K. Kuwabara, H. Inui, and M. Yamaguchi, Microstructure and Electrical Properties of Thin Films of ReSi1.75 Produced by Co-Sputtering, Intermetallics, 2002, 10(2), p 129-138
5. D. Hofman, C. Kleint, J. Thomas, and K. Wetzig, Investigation of Thermoelectric Silicide Thin Films by Means of Analytical Transmission Electron Microscopy, Ultramicroscopy, 2000, 81(3-4), p 271-277
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1. Crystal Structures, Superconducting Properties, and the Coloring Problem in ReAlSi and ReGaSi;Inorganic Chemistry;2020-11-16
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