Defect Classification of Electronic Board Using Dense SIFT and CNN-Reference-Cited by-同舟云学术

Defect Classification of Electronic Board Using Dense SIFT and CNN

Published:2018 Issue: Volume:126 Page:1673-1682
ISSN:1877-0509
Container-title:Procedia Computer Science
language:en
Short-container-title:Procedia Computer Science

Author:

Iwahori Yuji,Takada Yohei,Shiina Tokiko,Adachi Yoshinori,Bhuyan M.K.,Kijsirikul Boonserm

Publisher

Elsevier BV

Subject

General Engineering

Reference14 articles.

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2. A Method for Detecting Globally Distributed Defects by Using Learning with Mahalanobis Distance;Numada;ViEW,2007

3. A Pattern Defect Inspection Method by Grayscale Image Comparison without Precise Image Alignment;Onishi;Journal of IEICE,2003

4. Automatic optical inspection for detecting defects on printed circuit board inner layers;Rau;The International Journal of Advanced Manufacturing Technology,2005

5. A Neural Network Approach to Defect Classification on Printed Circuit Boards;Roh;JSPE,2001

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