1. On the strain determination in cross-sectioned heterostructures by TEM/LACBED;Armigliato;Inst. Phys. Conf. Ser.,1996
2. LACBED dynamical simulation in GeSi/Si SLS;Chen;J. Chin. Electron Microsc. Soc.,1998
3. Convergent beam diffraction studies of interfaces, defects and multilayers;Cherns;J. Electron Microsc. Tech.,1989
4. Surface relaxation of strained heterostructures revealed by Bragg line splitting in LACBED patterns;Chou;Ultramicroscopy,1994
5. Preparation of cross-sections of silicon specimens for transmission electron microscopy;Garulli;J. Microsc. Spectrosc. Electron.,1985