Convergent beam diffraction studies of interfaces, defects, and multilayers-Reference-Cited by-同舟云学术

Convergent beam diffraction studies of interfaces, defects, and multilayers

Published:1989-10 Issue:2 Volume:13 Page:111-122
ISSN:0741-0581
Container-title:Journal of Electron Microscopy Technique
language:en
Short-container-title:J. Elec. Microsc. Tech.

Author:

Cherns D.,Preston A. R.

Publisher

Wiley

Subject

Anatomy

Reference24 articles.

1. Size and sign of the Burgers vector from transmission micrographs

2. Three-dimensional strain-field information in convergent-beam electron diffraction patterns

3. Convergent-beam electron diffraction from AlGaAs/GaAs single quantum wells

4. Electron diffraction studies of strain in epitaxial bicrystals and multilayers

5. and (1986) Convergent beam diffraction studies of crystal defects. In: Proceedings of the 11th International Congress on Electron Microscopy. et al., eds. Kyoto, Japan, Vol. 1, The Japanese Society of Electron Microscopy, Tokyo, Japan, pp. 207-208.

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