Stochastic analysis of a parallel system with common-cause failures and critical human errors-Reference-Cited by-同舟云学术

Stochastic analysis of a parallel system with common-cause failures and critical human errors

Published:1989-01 Issue:4 Volume:29 Page:627-637
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon B.S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Common Mode Failure Analysis;Gangloff;IEEE Transactions on Power Apparatus and Systems,1975

2. Human Reliability: with human factors;Dhillon,1986

3. Mechanical Reliability: Theory, Models and Applications;Dhillon,1988

4. A 4-Unit Redundant System with Common-cause Failures;Dhillon;IEEE Transactions on Reliability,1979

5. A N-Unit Redundant System with Common-cause Failures;Chung;Microelectronics and Reliability,1979

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