Reliability of imperfect switching of cold stanby systems with multiple non-critical and critical errors-Reference-Cited by-同舟云学术

Reliability of imperfect switching of cold stanby systems with multiple non-critical and critical errors

Published:1995-12 Issue:12 Volume:35 Page:1479-1482
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Chung Who Kee

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. On common-cause failures-bibliography;Dhillon;Microelectron. Reliab.,1979

2. On human reliability-bibliography;Dhillon;Microelectron. Reliab.,1980

3. A k-out-of-N:G redundant system with cold standby units and common-cause failures;Chung;Micro-electron. Reliab.,1984

4. Human Reliability: with Human Factor;Dhillon,1986

5. Human Reliability: Analysis, Prediction, and Prevention of Human Errors;Park,1987

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