Author:
Farokhzad B.,Türkes P.,Wolfgang E.,Goser K.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. Reliability Testing and Analysis of IGBT Power Semiconductor Modules;Jacob,1994
2. Reliability Indicators;Jensen;Quality and Reliability Engineering International,1986
3. Charakterisierung von Ultraschall-Schweiβverbindungen durch Messen des elektrischen Widerstandes;Grigoraschwilli;Schweifβtechnik,1984
4. Accelerated Ageing with in-situ Electrical Testing;De Schepper;Quality and Reliability Engineering International,1994
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献