Accelerated ageing within situ electrical testing: A powerful tool for the building-in approach to quality and reliability in electronics-Reference-Cited by-同舟云学术

Accelerated ageing within situ electrical testing: A powerful tool for the building-in approach to quality and reliability in electronics

Published:1994 Issue:1 Volume:10 Page:15-26
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Qual. Reliab. Engng. Int.

Author:

de Schepper L.,de Ceuninck W.,Lekens G.,Stals L.,Vanhecke B.,Roggen J.,Beyne E.,Tielemans L.

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference13 articles.

1. and , ‘Building in reliability: making it work’, Proc. 2nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 91), Bordeaux, 1991, p. 19.

2. Industrial Perspective on Reliability of VLSI Devices

3. CECC 00 804, part 3, draft A, ‘General guide to components reliability’, July 1992.

4. and , ‘Reliability prediction: the applicability of high temperature stress testing’, Solid State Technology, September 1990, pp. 103–108.

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