Common-cause failure analysis of a parallel system with warm standby-Reference-Cited by-同舟云学术

Common-cause failure analysis of a parallel system with warm standby

Published:1993-07 Issue:9 Volume:33 Page:1321-1342
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon B.S.,Anude O.C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Reliability Engineering in Systems Design and Operation;Dhillon,1980

2. Reliability Analysis of a Non-identical Unit Parallel System with Common-Cause Failures;Dhillon;Microelectronics and Reliability,1991

3. A Common-Cause Failure Availability Model;Dhillon;Microelectronics and Reliability,1978

4. A Unit Redundant System with Common-Cause Failures;Dhillon;IEEE Transactions on Reliability,1979

5. Human Error Modelling of Parallel and Stand-By Redundant Systems;Dhillon;International Journal of Systems Science,1988

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