Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI)
Author:
Funder
U. S. Army Research Office
EPSRC
Newcastle University Digital Institute
Publisher
Elsevier BV
Subject
General Chemistry,General Materials Science
Reference30 articles.
1. Characterization of amorphous and nanocrystalline carbon films;Chu;Mater. Chem. Phys.,2006
2. A roadmap for graphene;Novosolev;Nature,2012
3. Accurate argon cluster-ion sputter yields: measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry;Cumpson;J. Appl. Phys.,2013
4. X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers;Cumpson;J. Vac. Sci. Technol. B,2013
5. Observed damage during argon gas cluster depth profiles of compound semiconductors;Barlow;J. Appl. Phys.,2014
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