Microindentations on W and Mo oriented single crystals: An STM study
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference10 articles.
1. STM profilometry of low-load Vickers indentations in a silicon crystal
2. Imaging of low-load indentations into Si and GaAs by scanning tunneling microscopy
3. Ceramic Hardness;McColm,1990
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