STM profilometry of low-load Vickers indentations in a silicon crystal
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/25/i=3/a=025/pdf
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1. Technique for shaping scanning tunneling microscope tips
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4. Microhardness of carbon-doped (111) p-type Czochralski silicon
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