Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction-Reference-Cited by-同舟云学术

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Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction

Published:1998-06 Issue:1-4 Volume:248 Page:104-108
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Darowski N.,Paschke K.,Pietsch U.,Wang K.,Forchel A.,Lübbert D.,Baumbach T.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. X‐ray diffraction reciprocal space mapping of a GaAs surface grating

2. Q. Shen, S.W. Kycia, E.S. Tentarelli, W.J. Schaff, L.F. Eastman, Phys. Rev. B 54 (1996) 16381.

3. Triple crystal x‐ray diffractometry of periodic arrays of semiconductor quantum wires

4. Characterization of lateral semiconductor nanostructures by means of x-ray grazing-incidence diffraction

5. N. Darowski, K. Paschke, U. Pietsch, K.H. Wang, A. Forchel, T. Baumbach, U. Zeimer, J. Phys. D, : Appl. Phys. 30 (1997) L55.

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