X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference16 articles.
1. Elastic lattice deformation in quantum-wire heterostructures
2. X-ray-diffraction study of size-dependent strain in quantum-wire structures
3. X-ray diffraction from corrugated crystalline surfaces and interfaces
4. X‐ray diffraction from laterally structured surfaces: Crystal truncation rods
5. Edge‐induced stress and strain in stripe films and substrates: A two‐dimensional finite element calculation
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1. Bibliography (1994–2004) of nanomaterials/nanostructures and their properties;Modelling and Simulation in Materials Science and Engineering;2004-12-08
2. Finite-element modelling of non-destructive material evaluation, an addendum: a bibliography (1997–2003);Modelling and Simulation in Materials Science and Engineering;2004-07-06
3. The use of synchrotron radiation techniques in the characterization of strained semiconductor heterostructures and thin films;Surface Science Reports;2004-05
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