The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin films
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Genetic Algorithms in Search, Optimization and Machine Learning;Goldberg,1989
2. Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry
3. The Genetic Algorithm: Foundations and Apllications in Structure Solution from Powder Diffraction Data
4. Experimental adaptive optimization of mass spectrometer ion optic voltages using a genetic algorithm
5. Nonspecular x-ray-reflectivity study of partially correlated interface roughness of a Mo/Si multilayer
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