Development of a Bayesian inference method for the analysis of X-ray reflectivity data

Abstract

Abstract X-ray reflectivity (XRR) is an experimental method used in various fields of materials science to investigate the physical properties of solid surfaces and the structure of interfaces. However, it is difficult to evaluate the reliability of the estimates obtained with this method. In this study, we propose a method for analyzing XRR data using Bayesian inference. Bayesian inference allows the uncertainty of the estimate to be evaluated, which also allows the measurement limit to be evaluated, and also shows that estimation is possible even in noisy situations.