Evaluation of stresses in NiNiO and CrCr2O3 during high temperature oxidation by in situ X-ray diffraction
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference46 articles.
1. Measurement of residual stresses by X-ray diffraction in a system obtained by high temperature oxidation
2. Determination of the stress level in growing NiO films by X-ray diffraction
3. A new experimental method for growth stress measurement
4. Int. Conf. on Residual Stresses II (ICRSII);Courty,1989
5. Measurement of stress in nickel oxide layers by diffraction of synchrotron radiation
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