Author:
Soelkner Gerald,Kreutle Johannes,Quincke Jörg,Kaindl Winfried,Wachutka Gerhard
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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4. Internal Characterization of IGBTs using the Backside Laser Probing Technique — Interpretation of Measurements by Numerical Simulations;Thalhammer,1998
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3 articles.
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