Author:
Hsieh Y.F.,Hwang Y.C.,Fu J.M.,Tsou Y.M.,Peng Y.C.,Chen L.J.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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1. Nano-Engineered Tunable Photonic Crystals;Springer Handbook of Electronic and Photonic Materials;2017
2. Nano-Engineered Tunable Photonic Crystals in the Near-IR and Visible Electromagnetic Spectrum;Springer Handbook of Electronic and Photonic Materials;2006
3. Applications of plan-view TEM analysis to IC debugging;Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743)