Probe test yield optimization based on canonical correlation analysis between process control monitoring variables and probe bin variables
Author:
Publisher
Elsevier BV
Subject
Artificial Intelligence,Computer Science Applications,General Engineering
Reference24 articles.
1. Fast characterization of threshold voltage fluctuation in MOS devices;Agarwal;IEEE Transactions on Semiconductor Manufacturing,2008
2. Targeted layout modifications for semiconductor yield/reliability enhancement;Allan;IEEE Transactions on Semiconductor Manufacturing,2004
3. Yield prediction via spatial modeling of clustered defect counts across a wafer map;Bae;IIE Transactions,2007
4. Data mining for improving a cleaning process in the semiconductor industry;Braha;IEEE Transactions on Semiconductor Manufacturing,2002
5. A neural-network approach to recognize defect spatial pattern in semiconductor fabrication;Chen;IEEE Transactions on Semiconductor Manufacturing,2000
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