Fabrication of marker area to align TEM tomographic tilt series of rod-shaped specimens
Author:
Publisher
Elsevier BV
Subject
Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science
Reference6 articles.
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4. Technical note: a tool for determining rotational tilt axis with or without fiducial markers;Kobayashi;Ultramicroscopy,2009
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Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Electron tomography in soft materials;Current Opinion in Solid State and Materials Science;2013-06
2. Position-controlled marker formation by helium ion microscope for aligning a TEM tomographic tilt series;Micron;2012-09
3. A convenient method for electron tomography sample preparation using a focused ion beam;Microscopy Research and Technique;2012-03-27
4. Calibration method of tilt and azimuth angles for alignment of TEM tomographic tilt series;Review of Scientific Instruments;2011-10
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