Calibration method of tilt and azimuth angles for alignment of TEM tomographic tilt series
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3650457
Reference7 articles.
1. 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography
2. Least-Squares Method of Alignment Using Markers
3. Tilt-series and electron microscope alignment for the correction of the non-perpendicularity of beam and tilt-axis
4. Transmission electron microtomography without the “missing wedge” for quantitative structural analysis
5. Double-tilt electron tomography
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