Reference15 articles.
1. Berriman, J., Bryan, R. K., Freeman, R., and Leonard, K. R. (1984). Methods for specimen thickness determination in electron microscopy. Ultramicroscopy
13:351–364.
2. Dengler, J. (1989). A multi-resolution approach to 3D reconstruction from an electron microscope tilt series solving the alignment problem without gold particles. Ultramicroscopy
30:337–348.
3. Fletcher, R. and Powell, M. J. D. (1963). A rapidly convergent descent method for minimization. Comput. J.
6:163–168.
4. Frank, J. (1980). The role of correlation techniques in computer image processing, in Computer Processing of Electron Microscope Images (P. W. Hawkes, ed.). Springer-Verlag, New York.
5. Frank, J., McEwen, B. F., Radermacher, M., Turner, J. N., and Rieder, C. L. (1987). Three-dimensional tomographic reconstruction in high voltage electron microscopy. J. Electron Microsc. Tech.
6:193–205.
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