Characterization of the cleaved edge cross section of the heterostructures with GaMnAs layer by the confocal micro-Raman spectroscopy-Reference-Cited by-同舟云学术

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Characterization of the cleaved edge cross section of the heterostructures with GaMnAs layer by the confocal micro-Raman spectroscopy

Published:2017-02 Issue: Volume:93 Page:38-42
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Kudrin A.V.,Plankina S.M.,Vikhrova O.V.,Nezhdanov A.V.,Mashin A.I.,Drozdov Yu.N.,Shvetsov A.V.

Funder

President of Russian Federation

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference21 articles.

1. Cross-sectional Raman spectra of InN epifilms;Chen;Appl. Phys. Lett.,2005

2. Observation of the electron-accumulation layer at the surface of InN by cross-sectional micro-Raman spectroscopy;Cho;Appl. Phys. Lett.,2013

3. Dilute ferromagnetic semiconductors: physics and spintronic structures;Dietl;Rev. Mod. Phys.,2014

4. Optical-phonon behavior in Ga1-xInxAs: the role of microscopic strains and ionic plasmon coupling;Groenen;Phys. Rev. B,1998

5. Light scattering by a multicomponent plasma coupled with longitudinal-optical phonons: Raman spectra of p-type GaAs:Zn;Irmer;Phys. Rev. B,1997

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1. The Effect of Mn Content on the Morphological, Structural and Optical Features of LT-MBE Grown (Ga,Mn)As Thin Films;SSRN Electronic Journal;2022

2. Interfacial stress characterization of GaN epitaxial layer with sapphire substrate by confocal Raman spectroscopy;Nanotechnology and Precision Engineering;2021-06-01

3. On the Combined Application of Raman Spectroscopy and Photoluminescence Spectroscopy for the Diagnostics of Multilayer Heterostructures;Semiconductors;2019-09

4. High-temperature intrinsic ferromagnetism in the (In,Fe)Sb semiconductor;Journal of Applied Physics;2017-11-14

5. Cleaved-edge photoluminescence spectroscopy of multilayer heterostructures;Semiconductors;2017-11

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