On the Combined Application of Raman Spectroscopy and Photoluminescence Spectroscopy for the Diagnostics of Multilayer Heterostructures-Reference-Cited by-同舟云学术

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On the Combined Application of Raman Spectroscopy and Photoluminescence Spectroscopy for the Diagnostics of Multilayer Heterostructures

Published:2019-09 Issue:9 Volume:53 Page:1207-1210
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Plankina S. M.,Vikhrova O. V.,Zvonkov B. N.,Zubkov S. Yu.,Kriukov R. N.,Nezhdanov A. V.,Pavlov D. A.,Pashen’kin I. Yu.,Sushkov A. A.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782619090148.pdf

Reference12 articles.

1. V. G. Golubev, V. Yu. Davydov, A. V. Medvedev, A. B. Pevtsov, and N. A. Feoktistov, Phys. Solid State 39, 1197 (1997).

2. W. Limmer, M. Glunk, S. Mascheck, A. Koeder, D. Klarer, W. Schoch, K. Thonke, R. Sauer, and A. Waag, Phys. Rev. 66, 205209 (2002).

3. E. Bonera, M. Fanciulli, and D. N. Batchelder, Appl. Phys. Lett. 81, 3377 (2002).

4. L. A. Fal’kovskii, Phys. Usp. 47, 249 (2004).

5. J. W. Chen, Y. F. Chen, H. Lu, and W. J. Schaff, Appl. Phys. Lett. 87, 041907 (2005).

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