Investigation of semiconductors with defects using Raman scattering
Author:
Publisher
Uspekhi Fizicheskikh Nauk (UFN) Journal
Subject
General Physics and Astronomy
Cited by 20 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Transport properties of nanoscopic solids as probed by spectroscopic techniques;Fundamentals and Properties of Multifunctional Nanomaterials;2021
2. Probing charge carrier transport regimes in BiFeO3 nanoparticles by Raman spectroscopy;Scripta Materialia;2020-05
3. Maximizing Short Circuit Current Density and Open Circuit Voltage in Oxygen Vacancy-Controlled Bi1–xCaxFe1–yTiyO3−δ Thin-Film Solar Cells;ACS Applied Materials & Interfaces;2020-03-02
4. On the Combined Application of Raman Spectroscopy and Photoluminescence Spectroscopy for the Diagnostics of Multilayer Heterostructures;Semiconductors;2019-09
5. Applications;Modern Raman Spectroscopy;2019-02-27
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