Minority carrier lifetimes using compensated differental open circuit voltage decay
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Post-Injection Barrier Electromotive Force ofp−nJunctions
2. Effect of emitter recombinations on the open circuit voltage decay of a junction diode
3. Depletion layer effects in the open-circuit- voltage-decay lifetime measurement
4. Determination of the minority carrier lifetime in the base of a back-surface field solar cell by forward current-induced voltage decay and photovoltage decay methods
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3. Study of deep levels in the Mg2Si grown by vertical Bridgeman method;Japanese Journal of Applied Physics;2022-12-23
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