A contactless minority lifetime probe of heterostructures, surfaces, interfaces and bulk wafers
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. Survey of defect‐mediated recombination lifetimes in GaAs epilayers grown by different methods
2. Electron‐hole recombination at the Si‐SiO2interface
3. Unusually Low Surface-Recombination Velocity on Silicon and Germanium Surfaces
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