A new technique for the determination of barrier height of Schottky barrier diodes
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. New technique for the determination of series resistance of Schottky barrier diodes
2. New technique for the determination of series resistance of Schottky barrier diodes
3. Electrical characteristics of Ti/Si(100) interfaces
4. Influence of thin interfacial silicon oxide layers on the Schottky-barrier behavior of Ti on Si(100)
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