Deep-level spectroscopy of Cr-doped GaAs using nondestructive acousto-electric voltage measurements
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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1. Investigation of interface states distribution in metal-oxide-semiconductor structures with very thin oxides by acoustic spectroscopy;Journal of Applied Physics;2014-10-14
2. Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques;Advances in Imaging and Electron Physics;1999
3. Trapping lifetime and carrier mobility measurements in CuInSe/sub 2/ using surface-acoustic-wave technique;IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control;1993-03
4. Characterization of semiconductor materials and devices using acoustoelectric voltage measurement;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1991-01
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