Charge injection into SiO2 from reverse-biased junctions
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. The Electrochem. Soc. Spring Meeting;Lenzlinger,1970
2. AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2
3. A new MNOS charge storage effect
4. MEMORY BEHAVIOR IN A FLOATING‐GATE AVALANCHE‐INJECTION MOS (FAMOS) STRUCTURE
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