Failure analysis of electronic components after long-term storage-Reference-Cited by-同舟云学术

Failure analysis of electronic components after long-term storage

Published:2015-01 Issue: Volume:47 Page:229-237
ISSN:1350-6307
Container-title:Engineering Failure Analysis
language:en
Short-container-title:Engineering Failure Analysis

Author:

Zhao Youhu^ORCID,Fu Guicui

Publisher

Elsevier BV

Subject

General Engineering,General Materials Science

Reference14 articles.

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4. Long-term non-operating reliability of electronic products;Pecht,1995

5. Long term storage reliability of antifuse field programmable gate arrays;Patil;Microelectron Reliab,2013

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