A case study of IC storage failures in Taipei trains-Reference-Cited by-同舟云学术

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A case study of IC storage failures in Taipei trains

Published:1998-12 Issue:12 Volume:38 Page:1811-1816
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Zhang Y,Pecht M,Lantz L

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference2 articles.

1. Pecht J, Pecht MG. Long-term non-operating reliability of electronic products. New York: CRC Press, 1995

2. Chen F, Osteraas AJ. Electrochemical dendrite formation during corrosion of connector leads. Electronic Packaging and Corrosion in Microelectronics 1987:175–8.

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Review of shelf life evaluation methods and a physics of failure approach for shelf life estimation for electronic components;Microelectronics Reliability;2019-08

2. Electronic Packages: Quality and Reliability;Reference Module in Materials Science and Materials Engineering;2016

3. Failure analysis of electronic components after long-term storage;Engineering Failure Analysis;2015-01

4. Prognostics and Health Management of Electronics;Encyclopedia of Structural Health Monitoring;2008-01-26

5. Corrosion in Microelectronics;Corrosion: Environments and Industries;2006

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