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Integrated circuit failure analysis and reliability prediction based on physics of failure

  • Published:2019-10 Issue: Volume:104 Page:714-726
  • ISSN:1350-6307
  • Container-title:Engineering Failure Analysis
  • language:en
  • Short-container-title:Engineering Failure Analysis

Author:

Jiao Jian,De Xinlin,Chen Zhiwei,Zhao Tingdi

Publisher

Elsevier BV

Subject

General Engineering,General Materials Science

Reference26 articles.

1. Reliability prediction of electronic equipment;Reiche;Microelectron. Reliab.,1975

2. Comparison of electronics-reliability assessment approaches;Cushing;Reliab. IEEE Trans.,1993

3. Physics-of-failure (PoF) methodology for electronic reliability;Hendricks;Reliab. Character. Electr. Electron. Syst.,2015

4. Physics-of-Failure Based Modeling and Lifetime Evaluation. Microelectronics Reliability;White,2008

5. Physics-of-failure: an approach to reliable product development//integrated reliability workshop;Pecht;Final Rep. Int. IEEE,1995

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