Author:
Zhang Chuang,Li Xiang,Fan Xinlin,Tang Tian,Qin Yong,Jia Limin,Wang Zhipeng
Publisher
Springer Nature Singapore
Reference10 articles.
1. Jiao, J., De, X.L., Chen, Z.W., et al.: Integrated circuit failure analysis and reliability prediction based on physics of failure. Eng. Fail. Anal. 104, 714–726 (2019)
2. Fu, G.C., Su, Y.T., Guo, W.D., et al.: Life prediction methodology of system-in-package based on physics of failure. Microelectron. Reliab. 88–90, 173–178 (2018)
3. Li, N.M.J., Das, D., McCluskey, P.: Review of shelf life evaluation methods and a physics of failure approach for shelf life estimation for electronic components. Microelectron. Reliab. 99, 152–160 (2019)
4. Zhu, S.P., Huang, H.Z., Peng, W.W., et al.: Probabilistic physics of failure-based framework for fatigue life prediction of aircraft gas turbine discs under uncertainty. Reliab. Eng. Syst. Saf. 146, 1–12 (2016)
5. Lv, W.M., Hu, D., Xie, J.S.: Case study of circuit board life prediction based on failure physics. J. Univ. Electron. Sci. Technol. China 42(04), 635–640 (2013). (in Chinese)