Author:
Cass T.R.,Hendricks D.,Jau J.,Dohse H.J.,Brodie A.D.,Meisburger W.D.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Proceeding of the International Symposium for Testing and Failure Analysis;Agricola,1989
2. Low-voltage electron-optical system for the high-speed inspection of integrated circuits
3. Testing integrated circuit microstructures using charging-induced voltage contrast
4. Proceedings of the 30th IEEE Reliability Physics Symposium;Jenkins,1992
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献