Performance optimization of the chemically amplified radiation resist RAY-PF

Author:

Ballhorn R.-U.,Dammel R.,David H.H.,Eckes Ch.,Fricke-Damm A.,Kreuer K.,Pawlowski G.,Przybilla K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Resists for X-ray Lithography;Encyclopedia of Materials: Science and Technology;2001

2. High aspect ratio resist structures by E-beam overexposure;Microelectronic Engineering;1995-02

3. Modeling and simulations of a positive chemically amplified photoresist for x-ray lithography;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1994-11

4. Transfer of single-layer positive resist sub-micrometer and nanometer structures into silicon;Microelectronic Engineering;1994-05

5. Chemically amplified soft-x-ray resists: sensitivity, resolution, and molecular photodesorption;Applied Optics;1993-12-01

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