On the deterministic generation of short test sequences for the e-beam test of scan-based designs-Reference-Cited by-同舟云学术

On the deterministic generation of short test sequences for the e-beam test of scan-based designs

Published:1992-03 Issue:1-4 Volume:16 Page:193-202
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Grüning Torsten,Groβ Josef,Geggier Andreas

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Future Trends in Electron Beam Testing;Wolfgang;Microelectronic Engineering,1987

2. Automatic Location of IC Design Errors Using an E-beam System;Melgara,1988

3. Electron Beam Tester with 10 ps Time Resolution;Tokodoro,1986

4. A Multi-sampling Waveform Measurement Method in the Electron Beam Tester;Sano,1986

5. A high speed signal averager for electron beam test systems;Machin;Microelectronic Engineering,1987

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Automatic fault diagnosis for scan-based designs;Microelectronic Engineering;1996-02

2. Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability;Microelectronic Engineering;1996-02

3. Generation of inherently periodical test patterns for the e-beam test of scan-based designs;Microelectronic Engineering;1994-03

4. Towards higher quality of design and test - perspectives of EBT tool integration;Microelectronic Engineering;1994-03

5. Implementation of laser beam sensitive cells: A new approach for integrated circuits testing;Quality and Reliability Engineering International;1994