Author:
Heinitz Matthias,Grüning Torsten
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Automatic Test Generation for Electron-Beam Testing of VLSI Circuits;Kinch;IEEE International Conference on Circuits and Computers,1982
2. On the Deterministic Generation of Short Test Sequences for the E-Beam Test of Scan-based Designs;Grüning;Microelectronic Engineering,1992
3. Design for Electron Beam Testability: On-Chip Generation of Periodic Test Sequences in a Scan Path Environment;Groβ;Microelectronic Engineering,1992
4. Future Trends in Electron Beam Testing;Wolfgang;Micro-electronic Engineering,1987
5. CONTEST - A Fast ATPG Tool for Very Large Combinational Circuits;Mahlstedt;Proceedings International Conference on Computer Aided Design,1990
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