Design for electron beam testability: On-chip generation of periodic test sequences in a scan path environment-Reference-Cited by-同舟云学术

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Design for electron beam testability: On-chip generation of periodic test sequences in a scan path environment

Published:1992-03 Issue:1-4 Volume:16 Page:203-212
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Groβ Josef,Grüning Torsten

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Photoemission Sampling Technique for High-Speed Integrated-Circuit Testing;Beha,1987

2. Optical Beam Induced Currents in MOS Transistors;Fritz,1989

3. Detectors for quantitative Voltage Contrast on Submicron Devices;Dinnis,1987

4. Magnetic Field Extraction of Secondary Electrons for Accurate Integrated Circuit Voltage Measurement;Garth;J. Vac. Sci. Technol. B.,1986

5. Dynamic Fault Imaging of VLSI Random Logic Devices;May,1984

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Autonomous Scan Patterns for Laser Voltage Imaging;IEEE Transactions on Emerging Topics in Computing;2021-04-01

2. Scan Integrity Tests for EDT Compression;IEEE Design & Test;2020-08

3. Generation of inherently periodical test patterns for the e-beam test of scan-based designs;Microelectronic Engineering;1994-03

4. Introduction;Electron Beam Testing Technology;1993

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