Microstructural gradients in thin hard coatings—tailor-made-Reference-Cited by-同舟云学术

Microstructural gradients in thin hard coatings—tailor-made

Published:1997-12 Issue:1-3 Volume:97 Page:308-312
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Fischer K.,Oettel H.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference12 articles.

1. Residual stress in ion-assisted coatings

2. Seemann–Bohlin X-ray diffractometry. I. Instrumentation

3. Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction

4. K. Fischer, P. John, H. Sahm, H. Oettel, Proc. of Werkstoffwoche '96, symposium 6, DGM-Informationsgesellschaft Verlag, Frankfurt, 1997, p. 799–804.

5. R. Wiedemann, T. Schulz-Kroenert, H. Oettel, Prakt. Metallographie (1997) in press.

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