Uncertainty of wavelength limitation due to stylus tip radius for engineering surface texture based on wavelength and amplitude by FFT-Reference-Cited by-同舟云学术

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Uncertainty of wavelength limitation due to stylus tip radius for engineering surface texture based on wavelength and amplitude by FFT

Published:2006-12 Issue:11-12 Volume:261 Page:1225-1231
ISSN:0043-1648
Container-title:Wear
language:en
Short-container-title:Wear

Author:

Yoshida Ichiro,Tsukada Tadao

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics

Reference11 articles.

1. ISO 3274:1996, GPS-Surface texture: Profile method; Nominal characteristics of contact (stylus) instruments.

2. Properties of engineering surface irregularities based on fractal dimension (2nd Report);Ito;J. JSPE,1992

3. Fractal or fiction;Whitehouse;Wear,2001

4. ISO 5436-1:2000, GPS-Surface texture: Profile method; Measurement standards-Part 1: Material measures.

5. Roughness parameters affected with the mean line and center line systems;Hara;J. JSPE,1996

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the optimal texture shape with the consideration of surface roughness;Scientific Reports;2022-09-01

2. Extension of the probe-tip error evaluation for areal surface roughness measurements using metrological AFM;Measurement: Sensors;2021-12

3. A standard used for probe-tip diameter evaluation in surface roughness measurements using metrological atomic force microscope;Measurement Science and Technology;2020-06-25

4. Assessment of the effect of stylus tip radius on milled, bored, and honed surfaces;The International Journal of Advanced Manufacturing Technology;2019-07-08

5. Extension of the range of profile surface roughness measurements using metrological atomic force microscope;Precision Engineering;2019-03

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