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Aberration corrected STEM by means of diffraction gratings

  • Published:2017-11 Issue: Volume:182 Page:36-43
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Linck Martin,Ercius Peter A.,Pierce Jordan S.,McMorran Benjamin J.

Funder

U.S. Department of Energy

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference46 articles.

1. Electron microscopy image enhanced;Haider;Nature,1998

2. Progress in aberration corrected scanning transmission electron microscopy;Dellby;J. Electron Microsc.,2001

3. Atomic-scale study of electric dipoles near charged an uncharged domain walls in ferroelectric films;Jia;Nat. Mater.,2008

4. Electron tomography at 2.4-ångström resolution;Scott;Nature,2012

5. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy;Krivanek;Nature,2010
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